Properties of Defect Modes of One-Dimensional Quaternary Defective Photonic Crystal Nanostructure

Sofyan A. Taya, Malek G. Daher

Abstract


A defective quaternary photonic crystal having the (ABCD)N/F/(ABCD)N+1, where A, B, C and D are the photonic crystal layers, F is the defect layer and N is the number of periods, is investigated. We focus on the properties of the defect mode such as resonant wavelength, full width at half maximum, quality factor and maximum transmittance. These properties are examined with the variation of many parameters such as the incidence angle, the defect layer position and thickness and the number of periods. An angle of incidence of 85° and a number of periods of 9 can be considered as optimum since they correspond to the highest quality factor and the lowest full width at half maximum which enable the proposed photonic crystal to be efficiently used as an optical sensor and a filter

Keywords


quaternary photonic crystal; transfer matrix method; detect layer; transmission spectrum; defect mode

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References


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DOI (PDF): https://doi.org/10.20508/ijsmartgrid.v6i2.231.g236

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